Descriptif ED-STE14 Advanced Mass Spectrometric Analysis
(Page créée avec « This formation aims at improving the notions on diverse mass spectrometers (ICP-MS, IRMS, SIMS, TIMS). Several aspects from the sample introduction to the detection and the … »)
 
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J.-L. BIRCK: Magnetism and Electrostatics: Generalities, TIMS
J.-L. BIRCK: Magnetism and Electrostatics: Generalities, TIMS
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P. CARTIIGNY: Gas source spectrometer
P. CARTIIGNY: Gas source spectrometer
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P. LOUVAT: Source and intriduction system for ICP
P. LOUVAT: Source and intriduction system for ICP
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P. BURCKEL: Specificities of quadrupolar ICP
P. BURCKEL: Specificities of quadrupolar ICP
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M. THARAUD: Specificities of ICP Elements
M. THARAUD: Specificities of ICP Elements
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M. CHAUSSIDON: Ionic probe
M. CHAUSSIDON: Ionic probe
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M. MOREIRA: Noble gases spectrometer
M. MOREIRA: Noble gases spectrometer
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J. BOUCHEZ: Data analysis, Statistics, Error propagation
J. BOUCHEZ: Data analysis, Statistics, Error propagation

Version actuelle en date du 18 octobre 2018 à 07:28

This formation aims at improving the notions on diverse mass spectrometers (ICP-MS, IRMS, SIMS, TIMS). Several aspects from the sample introduction to the detection and the data analysis will be covered by specialists in every techniques from IPGP. Students can thus improve their understanding on their field as well as learning from others.

J.-L. BIRCK: Magnetism and Electrostatics: Generalities, TIMS

P. CARTIIGNY: Gas source spectrometer

P. LOUVAT: Source and intriduction system for ICP

P. BURCKEL: Specificities of quadrupolar ICP

M. THARAUD: Specificities of ICP Elements

M. CHAUSSIDON: Ionic probe

M. MOREIRA: Noble gases spectrometer

J. BOUCHEZ: Data analysis, Statistics, Error propagation